Test Data Generation for Product Lines – A Mutation Testing Approach

Modern product lines typically generate large and complex software products. There is an associated cost increase from the need to test such products, especially for a safety-critical embedded system. We propose a method by which characteristics of the product line can be used as a way of reducing the test data search space and providing effective test data for relevant testing problems. We illustrate this with a solution to the problem of checking that a generated instance is a correct reflection of the required behaviour.